Non-silicon n-type and p-type stacked transistors for integrated circuit devices

ABSTRACT

Multiple non-silicon semiconductor material layers may be stacked within a fin structure. The multiple non-silicon semiconductor material layers may include one or more layers that are suitable for P-type transistors. The multiple non-silicon semiconductor material layers may further include one or more one or more layers that are suited for N-type transistors. The multiple non-silicon semiconductor material layers may further include one or more intervening layers separating the N-type from the P-type layers. The intervening layers may be at least partially sacrificial, for example to allow one or more of a gate, source, or drain to wrap completely around a channel region of one or more of the N-type and P-type transistors.

BACKGROUND

Device density in integrated circuits (ICs) has increased for decades inconformance with Moore's law. However, as the dimensions of a devicestructure shrink with each technology generation, it becomesincreasingly difficult to further reduce structural dimensions.Next-generation transistor architectures may employ gate-all-around(GAA) architectures (also known as nanowire/nanoribbon transistors) toenable a further reduction in channel length (e.g., for theComplementary Metal Oxide Semiconductor (CMOS) 10 nm technology node,and beyond).

Three-dimensional (3D) scaling is now of considerable interest asreductions in z-height (device thickness) offer another avenue ofincreasing overall device density and IC performance. 3D devicefabrication techniques suitable for novel non-silicon materials are allthe more advantageous as higher channel mobility materials may offersynergy between higher device density and superior transistorperformance.

BRIEF DESCRIPTION OF THE DRAWINGS

The material described herein is illustrated by way of example, and notby way of limitation, in the accompanying figures. For simplicity andclarity of illustration, elements illustrated in the figures are notnecessarily drawn to scale. For example, the dimensions of some elementsmay be exaggerated relative to other elements for clarity. Further,where considered appropriate, reference labels have been repeated amongthe figures to indicate corresponding or analogous elements. In thefigures:

FIG. 1A illustrates an isometric view of a stacked non-silicon N-Typeand P-Type nanowire transistor structure, in accordance with someembodiments;

FIG. 1B illustrates an isometric sectional view of the stackednon-silicon N-Type and P-Type nanowire transistor structure illustratedin FIG. 1A, in accordance with some embodiments;

FIG. 2 illustrates a flow diagram illustrating methods for fabricatingstacked non-silicon N-Type and P-Type nanowire transistor structures, inaccordance with some embodiments;

FIG. 3 illustrates a flow diagram illustrating methods for fabricatingstacked non-silicon N-Type and P-Type nanowire transistor structures, inaccordance with some embodiments;

FIGS. 4, 5, 6, 7A, 7B, 7C, 8, 9, 10 and 11 illustrate isometricsectional views of stacked non-silicon nanowire transistor structuresevolving as various operations in the methods illustrated in FIG. 2 or 3are performed, in accordance with some embodiments;

FIG. 12 illustrates a mobile computing platform and a data servermachine including a processor with stacked non-silicon transistorstructures, in accordance with some exemplary embodiments; and

FIG. 13 illustrates a functional block diagram of an electroniccomputing device, in accordance with some exemplary embodiments.

DETAILED DESCRIPTION

One or more embodiments are described with reference to the enclosedfigures. While specific configurations and arrangements are depicted anddiscussed in detail, it should be understood that this is done forillustrative purposes only. Persons skilled in the relevant art willrecognize that other configurations and arrangements are possiblewithout departing from the spirit and scope of the description. It willbe apparent to those skilled in the relevant art that techniques and/orarrangements described herein may be employed in a variety of othersystems and applications other than what is described in detail herein.

Reference is made in the following detailed description to theaccompanying drawings, which form a part hereof and illustrate exemplaryembodiments. Further, it is to be understood that other embodiments maybe utilized and structural and/or logical changes may be made withoutdeparting from the scope of claimed subject matter. It should also benoted that directions and references, for example, up, down, top,bottom, and so on, may be used merely to facilitate the description offeatures in the drawings. Therefore, the following detailed descriptionis not to be taken in a limiting sense and the scope of claimed subjectmatter is defined solely by the appended claims and their equivalents.

In the following description, numerous details are set forth. However,it will be apparent to one skilled in the art, that embodiments may bepracticed without these specific details. In some instances, well-knownmethods and devices are shown in block diagram form, rather than indetail, to avoid obscuring the embodiments. Reference throughout thisspecification to “an embodiment” or “one embodiment” or “someembodiments” means that a particular feature, structure, function, orcharacteristic described in connection with the embodiment is includedin at least one embodiment. Thus, the appearances of the phrase “in anembodiment” or “in one embodiment” or “some embodiments” in variousplaces throughout this specification are not necessarily referring tothe same embodiment. Furthermore, the particular features, structures,functions, or characteristics may be combined in any suitable manner inone or more embodiments. For example, a first embodiment may be combinedwith a second embodiment anywhere the particular features, structures,functions, or characteristics associated with the two embodiments arenot mutually exclusive.

As used in the description and the appended claims, the singular forms“a”, “an” and “the” are intended to include the plural forms as well,unless the context clearly indicates otherwise. It will also beunderstood that the term “and/or” as used herein refers to andencompasses any and all possible combinations of one or more of theassociated listed items.

The terms “coupled” and “connected,” along with their derivatives, maybe used herein to describe functional or structural relationshipsbetween components. It should be understood that these terms are notintended as synonyms for each other. Rather, in particular embodiments,“connected” may be used to indicate that two or more elements are indirect physical, optical, or electrical contact with each other, withoutany intermediary materials or devices. “Coupled” may be used toindicated that two or more elements are in either direct or indirect(with other intervening elements between them) physical or electricalcontact with each other, and/or that the two or more elements co-operateor interact with each other (e.g., as in a cause an effectrelationship), through one or more passive or active intermediarymaterials or devices.

A “device” may generally refer to an apparatus according to the contextof the usage of that term. For example, a device may refer to a stack oflayers or structures, a single structure or layer, a connection ofvarious structures having active and/or passive elements, etc. Generallya device is a three dimensional structure with a lateral x-y plane and aheight along the z direction within an x-y-z Cartesian coordinatesystem. The plane of the device may also be the plane of an apparatus,which comprises the device.

The terms “over,” “under,” “front side,” “back side,” “top,” “bottom,”“over,” “under,” and “on” as used herein refer to a relative position ofone component, structure, or material with respect to other referencedcomponents, structures or materials within a device, where such physicalrelationships are noteworthy. These terms are employed herein fordescriptive purposes only and predominantly within the context of adevice z-axis and therefore may be relative to an orientation of adevice. Hence, a first material “over” a second material in the contextof a figure provided herein may also be “under” the second material ifthe device is oriented upside-down relative to the context of the figureprovided. In the context of materials, one material disposed over orunder another may be directly in contact or may have one or moreintervening materials. Moreover, one material disposed between twomaterials may be directly in contact with the two layers or may have oneor more intervening layers. In contrast, a first material “on” a secondmaterial is in direct contact with that second material. Similardistinctions are to be made in the context of component assemblies.

The term “adjacent” generally refers to a position of a thing beinglaterally (within an x-y plane) next to (e.g., immediately next to), oradjoining another thing (e.g., abutting it).

The term “between” may be employed in the context of the z-axis, x-axisor y-axis of a device. A material that is between two other materialsmay be in contact with one or both of those materials, or it may beseparated from both of the other two materials by one or moreintervening materials. A material “between” two other materials maytherefore be in contact with either of the other two materials, or itmay be coupled to the other two materials through an interveningmaterial. A device that is between two other devices may be directlyconnected to one or both of those devices, or it may be separated fromboth of the other two devices by one or more intervening devices.

Unless otherwise specified the use of the ordinal adjectives “first,”“second,” and “third,” etc., to describe a common object, merelyindicates that different instances of like objects are being referredto, and are not intended to imply that the objects so described must bein a given sequence, either temporally, spatially, in ranking or in anyother manner.

As used throughout this description, and in the claims, a list of itemsjoined by the term “at least one of” or “one or more of” can mean anycombination of the listed terms. For example, the phrase “at least oneof A, B or C” can mean A; B; C; A and B; A and C; B and C; or A, B andC.

Unless otherwise specified in the explicit context of their use, theterms “substantially equal,” “about equal” and “approximately equal”mean that there is no more than incidental variation between amongthings so described. In the art, such variation is typically no morethan +/−10% of a predetermined target value.

As described further below, multiple non-silicon semiconductor materiallayers may be stacked within a single fin structure. The multiplenon-silicon semiconductor material layers may include one or more“P-type” layers that are suitable (e.g., offer higher hole mobility thansilicon) for P-type transistors. The multiple non-silicon semiconductormaterial layers may further include one or more one or more “N-type”layers that are suitable (e.g., offer higher electron mobility thansilicon) for N-type transistors. The multiple non-silicon semiconductormaterial layers may further include one or more intervening layersseparating the N-type from the P-type layers. The intervening layers maybe at least partially sacrificial, for example to allow one or more of agate, source, or drain to wrap completely around a channel region of oneor more of the N-type and P-type transistors. The multiple non-siliconsemiconductor material layers may be fabricated, at least in part, withself-aligned techniques such that a stacked CMOS device may include botha high-mobility N-type and P-type transistor with a footprint of asingle finFET.

In some embodiments, lattice mismatch within the stack of N-type andP-type transistors is controlled through use of Ge, and III-V alloymaterials having a close lattice match with Ge. For example, in someembodiments a stack of P-type and N-type transistors includes Ge, andInGaAs channel semiconductor. As described further below, Ge may beincluded in base layer of a stack of non-silicon semiconductor materiallayers. This Ge base layer may facilitate heteroepitaxy from a siliconsubstrate and/or facilitate epitaxial stack growth following a layertransfer. This Ge base layer may be employed within a channel region ofa P-type transistor, or employed only as a sub-fin epitaxial seed layer.A III-V alloy material having high electron mobility, such as InGaAs,may be included in an upper layer of a stack of non-siliconsemiconductor material layers. This III-V alloy layer may be employedwithin a channel region of an N-type transistor. One or more interveningIII-V alloy layers between the P-type and N-type transistor layers mayfacilitate heteroepitaxy of the semiconductor material layers and mayfurther facilitate electrical isolation and/or fabrication of stackednanowire FETs.

FIG. 1A is an isometric view of external surfaces of a stackednon-silicon (e.g., high-mobility) CMOS device structure including both atransistor structure 102 and a transistor structure 103, in accordancewith some embodiments. As shown, stacked non-silicon CMOS devicestructure 101 is over a crystalline region 105. An isolation dielectricmaterial 110 separates crystalline region 105 from device structure 101.Transistor structure 102 includes a source and drain 111. In someexemplary embodiments, source and drain 111 includes semiconductormaterial that has a first conductivity type, such as P-type or N-type.Transistor structure 103 further includes source and drain 112, whichare vertically (e.g., in z-dimension) separated from source and drain111. In some exemplary embodiments, source and drain 112 includesemiconductor that has a second conductivity type, complementary to theconductivity type of source and drain 111. For example, in embodimentswhere source and drain 111 include P-type semiconductor, source anddrain 112 include N-type semiconductor. Alternatively, in embodimentswhere source and drain 111 include N-type semiconductor, source anddrain 112 include P-type semiconductor. Hence, device structure 101 isreferred to herein as a stacked CMOS device structure.

Source and drain 111 may include monocrystalline or polycrystallinesemiconductor. In some embodiments, source and drain 111 include a GroupIV or III-V semiconductor doped with any impurity dopants known to besuitable for the desired conductivity type, and to any concentrationknown to be suitable for transistors. Source and drain 112 may likewiseinclude a monocrystalline or polycrystalline semiconductor. In someembodiments, source and drain 112 include a Group IV or III-Vsemiconductor doped with any impurity dopants known to be suitable forthe desired conductivity type, and to any concentration known to besuitable for transistors. In an embodiment where source and drain 111 isP-Type, source and drain 111 is a high mobility Group IV semiconductor(e.g., Ge) including any suitable concentration of acceptor impurities.In an embodiment where source and drain 112 is N-type, source and drain112 is a high mobility Group III-V semiconductor alloy including anysuitable concentration of donor impurities. The group III-V alloy may beany binary, ternary, or quaternary III-V alloy known to be suitable assource and drain material. In one specific example, source and drain 112includes at least In and As (e.g., binary InAs). Source and drain 111may be “raised” (e.g. epitaxial growths), having larger lateral width(e.g., x-dimensions) and/or height (e.g., z-dimensions) than that ofchannel material layers under gate electrode 150. Source and drain 112may also be raised, having larger lateral width (e.g., x-dimensions)and/or height (e.g., z-dimensions) than channel material layers undergate electrode 150. In the exemplary embodiment shown in FIG. 1A, bothsource and drain 111 and source and drain 112 are raised. Alternatively,source and drain 111 and/or source and drain 112 may be impurity dopedends of semiconductor material layers that have been patterned into astacked structure and separated through removal of an interveningsacrificial material layer.

A dielectric material 180 is over source and drain 111, as well as,source and drain 112. Dielectric material 180 separates source and drain111 from source and drain 112 in the illustrated example. Dielectricmaterial 180 may have any composition of suitable dielectric strengthfor the purpose of electrically isolating laterally adjacent devicesand/or vertically adjacent devices. Dielectric material 180 may be anymaterial known to be suitable as an interlayer dielectric (ILD), forexample. In some embodiments, dielectric material 180 is a compound ofsilicon and/or a compound of oxygen, and/or a compound of nitrogen.Examples include silicon dioxide, silicon nitride, silicon oxynitride,and low-k materials (e.g., having a relative permittivity below 3.3).

A first channel material or region, below gate electrode 150, couplestogether source and drains 111. As used herein, a “channel material” isa semiconductor material layer within which a channel is to be developedduring operation of a transistor. Hence, a “channel material” is inreference to a physical structure that is present regardless of whethera channel is present within that layer (e.g., during an operativetransistor state), or not (e.g., during an inoperative transistorstate.). Gate electrode 150 is further separated from source and drains111 by an external dielectric spacer 130. Another channel material orregion, also below gate electrode 150, further couples together sourceand drains 112. In exemplary embodiments, at least one of these channelregions comprises other than silicon. In some advantageous embodiments,both of these channel regions comprise other than silicon. The channelregions may have any non-silicon semiconductor composition known to havehigher mobility than silicon, as further described below. Gate electrode150 is further separated from source and drains 111 by an externaldielectric spacer 130. Dielectric spacer 130 likewise separates gateelectrode 130 from source and drains 112. In the illustrated example, agate dielectric 140 is also visible in FIG. 1A. The gate electrode 150and gate dielectric 140 may therefore be operable with the channelsemiconductor materials as two metal-oxide-semiconductor (MOS)transistors of complementary conductivity type.

CMOS structure 101 may be operable such that transistor structure 102 isin an “ON” state under a first gate bias that also places transistorstructure 103 in an “OFF” state. CMOS structure 101 may be furtheroperable such that transistor structure 102 is in an “OFF” state under asecond gate bias that also places transistor structure 103 in an “ON”state. In some specific examples, CMOS structure 101 is operable as avertically stacked CMOS inverter where for a first (e.g., low) inputlevel, the PMOS (e.g., transistor structure 102) is “ON” and the NMOS(e.g., transistor structure 102) is “OFF.” In this condition, an outputvoltage of transistor structure 102 is substantially the same as thesource input voltage with the PMOS operable as a “pull-up” transistor.Similarly, a second (e.g., high) input level, the NMOS (e.g., transistorstructure 103) is “ON” and the PMOS (e.g., transistor structure 103) is“OFF.” In this condition, an output voltage of transistor structure 103may be substantially at a ground potential with the NMOS operable as a“pull-down” transistor.

Device structure 101 includes two or more source or drain terminalcontacts. In some embodiments, the source or drain terminal contactsmaintain electrical isolation between all four source and drainterminals 111, 112 such that all four source and drain terminals 111,112 may be coupled to independent nodes of an integrated circuit. Forexample, in FIG. 1A, a first source or drain terminal contact S/D₁ is incontact with a first source and drain 111 while a second source or drainterminal contact S/D₂ is in contact with a first source and drain 112. Afirst drain or source terminal contact D/S₁ is in contact with anothersource and drain 111 while a second drain or source terminal contactD/S₂ is in contact with another source and drain 112. Althoughillustrated in schematic form for the sake of clarity, terminal contactsS/D₁, S/D₂, D/S₁, D/S₂, may each have any structure suitable for asource or drain terminal contact. For example, terminal contacts S/D₁,S/D₂, D/S₁, D/S₂ may each include one or more contact metals and/orconductive via structures that extend through dielectric material 180from an overlying metallization level (not depicted) substantially alongthe route schematically shown in FIG. 1A.

In some embodiments where all terminal contacts S/D₁, S/D₂, D/S₁, D/S₂have a “top-down” architecture, source and drain 111 have lateral lengthL1 (e.g., as measured from a centerline of gate electrode 150) thatexceeds lateral length L2 of source and drain 112. Lateral length L1 maybe greater than lateral length L2 by an amount sufficient to maintainelectrical isolation (e.g., lateral separation) between terminalcontacts S/D₁, S/D₂ and/or between terminal contacts D/S₁, D/S₂.

In some alternative embodiments, two or more of terminal contacts S/D₁,S/D₂, D/S₁, D/S₂ may have a “bottom-up” architecture. For example, inFIG. 1A, terminal contacts S/D₁′ and D/S₁′ are further illustrated withdashed lines demarking a route through isolation dielectric material110. For such embodiments, source and drain 111 may have a laterallength L1 that exceeds lateral length L2 of source and drain 112, orlateral length L1 may be substantially the same as lateral length L2.

In some embodiments, the source or drain terminal contacts electricallycouple together two or more of source and drain terminals 111, 112. Forexample, in FIG. 1A, source or drain terminal contact S/D₂ may be incontact both a first of source and drain 111 and a first of source anddrain 112. For such embodiments, terminal contacts S/D₁ and S/D₂ maycomprise a single block contact metal and/or conductive via structure.Hence terminal contact S/D₂ may electrically interconnect either asource or drain 111 with either of a source or drain 112. As anotherexample, source or drain terminal contact D/S₂ may be in contact both asecond of source and drain 111 and a second of source and drain 112. Forsuch embodiments, terminal contacts D/S₁ and D/S₂ may comprise a singleblock contact metal and/or conductive via structure. Hence terminalcontact S/D₂ may also electrically interconnect either a source or drain111 with either of a source or drain 112. In further embodiments, onlyone of source and drain 111 is coupled to only one of source or drain112. As one specific example, sources of transistors 102 and 103 may betied together by terminal contacts S/D₁ and/or S/D₂ while drains oftransistors 102 and 103 are independently interconnected through D/S₁and D/S₂. In another specific example, drains of transistors 102 and 103may be tied together by terminal contacts D/S₁ and/or D/S₂ while sourcesof transistors 102 and 103 are independently interconnected through S/D₁and S/D₂.

FIG. 1B is an isometric sectional view further illustrating internalportions and interfaces of CMOS device structure 101 as viewed along theplane 181 denoted in FIG. 1A. In FIG. 1B, a channel material 115Aincluding a first non-silicon semiconductor material extends a laterallength between a source and drain 111 while a channel material 115Bincluding a second non-silicon semiconductor material extends a laterallength between a source and drain 112. In the illustrative embodiment,semiconductor channel materials 115A and 115B are aligned in a verticalstack (e.g., in the z-dimension). Within the lateral length of eachsemiconductor channel material 115A, 115B there is a channel regiondisposed between two end portions 116 denoted in dashed line. Endportions 116 couple channel regions of channel materials 115A-115B tosource and drains 111, 112, respectively. End portions 116 may includethe same semiconductor material as the channel region, or may includethe same semiconductor material as the source and drain. Gate electrode150 is separated from channel materials 115A and 115B by gate dielectric140. Within at least the channel region the gate stack including gateelectrode 150 and gate dielectric 140 is between channel material 115Aand isolation dielectric 110 and/or crystalline region 105. Within atleast the channel region the gate stack is also between channel material115A and channel material 115B. An embedded spacer 120 is between endportions 116 and isolation dielectric 110 and/or crystalline region 105.Embedded spacer 120 may have any dielectric composition suitable as agate spacer for transistor applications, such as, but not limited to,materials comprising both silicon and oxygen (e.g., SiO, SiOC, SiON)and/or both silicon and nitrogen (e.g., SiN, SiON). In some exemplaryembodiments, embedded spacer 120 provides a separation of no more than 5nm (e.g., 1-5 nm).

Notably, CMOS structure 101 is illustrated as including only onesemiconductor channel material coupled to each source and drain.However, the illustrated structure is merely an example and one or moreof the channel materials 115A and 115B may be replicated, for example toincrease the current carrying capability of one or more of a PMOS orNMOS transistor. For example, a multi-layered fin may increasing toinclude additional channel materials, such as two channel materials 115Aand two channel materials 115B, or three channel materials 115A andthree channel materials 115B, or four channel materials 115A and fourchannel materials 115B, etc. For such embodiments, additional channelmaterials 115A may be coupled in parallel to source and drain 111 toincrease the current carrying capability of the transistor. Likewise,additional channel materials 115B may be coupled in parallel to sourceand drain 112. Hence, CMOS structure 101 may have substantially the sameexternal structure illustrated in FIG. 1A with the internal structureillustrated in FIG. 1B deviating to include additional channelmaterials.

For some exemplary embodiments, substrate crystalline region 105comprises silicon (Si), which may be advantageous for integration ofstructure 101 on large format substrate (e.g., 300-450 mm diameters).Crystallographic orientation of a substantially monocrystallinesubstrate in exemplary embodiments is advantageously (100), but may alsobe (111), or (110). Other crystallographic orientations are alsopossible. For example, a substrate working surface may be miscut, oroffcut 2-10° toward [110]. Other substrate embodiments are alsopossible, with some examples including silicon-carbide (SiC), sapphire,a III-V compound semiconductor (e.g., GaAs), germanium (Ge), orsilicon-germanium (SiGe). In the illustrated embodiment, isolationdielectric 110 separates crystalline region 105 from an overlying devicelayer 107. For such embodiments, device layer 107, isolation dielectric110 and crystalline region 105 may be layers of semiconductor oninsulator (SOI) substrate. While device layer 107 may be silicon (e.g.,monocrystalline silicon), in some advantageous embodiments device layer107 comprises Ge (e.g., monocrystalline Ge). Monocrystalline Ge has abetter lattice match with III-V alloys than does silicon, potentiallyenabling better crystal quality in the channel materials of CMOS device101. In still other embodiments, device layer 107 is a group III-Vsemiconductor alloy.

Notably, CMOS structure 101 is applicable to a wide variety ofsemiconductor material systems including non-silicon systems (e.g.,Ge-based group IV, or group III-V alloy systems). In some embodiments,one of channel materials 115A and 116B is a crystal including Ge (e.g.,intrinsic Ge or SiGe alloy) while another of channel materials 115A and116B is a crystal including a III-V alloy. The III-V alloy may be anybinary, tertiary, or quaternary alloy suitable for a transistor channel.In some embodiments, one of semiconductor channel materials 115A and116B is a Ge crystal (e.g., intrinsic Ge) while another of semiconductorchannel materials 115A and 115B is a III-V crystal (e.g., GaAs, InP,InAs, InGaAs, AlGaAs, GaP, AlAs, InGaP, InSb, GaAsSb). In one suchembodiment, where transistor structure 102 is a P-Type transistor andtransistor structure 103 is an N-Type transistor, channel material 115Ais a Ge crystal (e.g., monocrystalline), and channel material 115B is anInGaAs crystal (e.g., monocrystalline). For these exemplary embodiments,the Ge crystal has the advantage of high hole mobility while the InGaAscrystal has the advantage of high electron mobility. Lattice mismatchbetween the InGaAs and Ge can be minimal as GaAs has substantially thesame lattice constant as Ge. Indium can be introduced into channelmaterials 115B to some threshold concentration that maintains a desiredmatch between crystalline layers. For some In_(x)Ga_(1−x)As embodiments,In content (x) may be as high as 0.7 (e.g., In_(0.7)Ga_(0.3)As) for peakcarrier mobility. However, in some advantageous In_(x)Ga_(1−x)Asembodiments where the InGaAs layer for an N-Type transistor is stackedupon a Ge (SiGe)-based P-Type transistor material, indium content (x) isless than 0.5, and more advantageously between 0.2 and 0.4.In_(x)Ga_(1−x)As that has a concentration of 0.2 to 0.4 has theadvantage of a better lattice match to Ge. Stacking the InGaAs crystalover the Ge crystal (rather than doing the opposite arrangement) mayoffer the further advantages of limiting lattice mismatch to anuppermost semiconductor layer of CMOS device structure 101. Otherembodiments where channel material 115A is a crystal including a GroupIII-V alloy. (e.g., GaAs, InP, InAs, InGaAs, AlGaAs, GaP, AlAs, InGaP,InSb, GaAsSb) and channel material 115B is also a crystal including aGroup III-V alloy (e.g., GaAs, InP, InAs, InGaAs, AlGaAs, GaP, AlAs,InGaP, InSb, GaAsSb) are also possible.

In the example illustrated in FIG. 1B, device layer 107 is betweenisolation dielectric 110 and source and drain 111. Where both devicelayer 107 and source and drain 111 are the same material (e.g., bothGe), an interface between device layer 107 and source and drain 111 maynot be evident (e.g., in a TEM). Device layer 107 may also extendbetween isolation dielectric 110 and embedded spacer 120, as shown.

Gate dielectric 140 may have any composition and any thickness known tobe suitable for transistors having a predetermined semiconductorcomposition and that are operable under predetermined bias conditions.In some embodiments, gate dielectric 140 is a material having a moderaterelative permittivity (e.g., k value below 9), such as, but not limitedto silicon dioxide, silicon oxynitride, or silicon nitride. In someother embodiments, gate dielectric 140 is a material having a highrelative permittivity (e.g., k value above 10). The high-k dielectricmaterial may include elements such as hafnium, silicon, oxygen,titanium, tantalum, lanthanum, aluminum, zirconium, barium, strontium,yttrium, lead, scandium, niobium, and zinc. The high-k material in someembodiments is a metal oxide (e.g., comprising one or more of hafniumoxide, hafnium silicon oxide, lanthanum oxide, lanthanum aluminum oxide,zirconium oxide, zirconium silicon oxide, tantalum oxide, titaniumoxide, barium strontium titanium oxide, barium titanium oxide, strontiumtitanium oxide, yttrium oxide, aluminum oxide, lead scandium tantalumoxide, and lead zinc niobate). The high-k material in some embodimentsis a metal silicate (e.g., comprising one or more of above metals,oxygen and silicon). In still other embodiments, gate dielectric 140includes two or more dielectric material layers, such as, but notlimited to, a layer with a higher relative permittivity over a layerwith a lower relative permittivity. The one or more layers may includesilicon oxide, silicon dioxide (SiO₂) and/or a high-k dielectricmaterial.

Gate electrode 150 may have any composition to be suitable forcontrolling the channel conductivity of a semiconductor channel. Gateelectrode 150 may have any suitable work function and may include adoped semiconductor (e.g., polysilicon), or an elemental metal layer, ametal alloy layer, and/or laminate structure. The gate electrode 150 mayinclude a mid-gap work function metal suitable for both of thecomplementary conductivity types of the semiconductor materials chosenfor channel materials 115A and 115B. In some implementations, gateelectrode 150 includes a stack of two or more metal layers, where one ormore metal layers are work function metal layers and at least one metallayer is a conductive fill layer. Examples of work function metalsinclude ruthenium, palladium, platinum, cobalt, nickel, and conductivemetal oxides (e.g., ruthenium oxide), hafnium, zirconium, titanium,tantalum, aluminum, alloys of these metals, and carbides of these metalssuch as hafnium carbide, zirconium carbide, titanium carbide, tantalumcarbide, and aluminum carbide.

A number of methods may be employed to fabricate CMOS structure 101.FIG. 2 is a flow diagram illustrating methods 201 for fabricating a CMOSstructure with stacked N-type and P-Type transistors employing anon-silicon channel semiconductor. Methods 301 may be employed, forexample, to fabricate CMOS structure 101, for example. Referring to FIG.2, methods 201 begin at operation 210 where a multi-layered non-siliconfin is formed over a workpiece. In some embodiments, the workpieceincludes a semiconductor wafer, such as a large format (e.g., 300-450mm) silicon wafer. The workpiece may include one or more underlyingdevice layers, for example, and need not be a virgin starting wafer asembodiments herein are not limited in this context.

In some embodiments, a multi-layered fin structure is formed over aGe-on-insulator (GOI) substrate. The GOI substrate may have beengenerated upstream of methods 201 according to any technique, such as,but not limited to, wafer-level bonding and layer-transfer. At operation210 a non-selective blanket (e.g., wafer-level) film stack growth isperformed over the GOI (or other SOI) substrate. The semiconductorlayers grown at operation 210 may advantageously include at least onenon-silicon material layer suitable for N-type transistor fabricationand at least on non-silicon material layer suitable for P-typetransistor fabrication. Any suitable epitaxial growth techniques, suchas, but not limited to, molecular beam epitaxy (MBE) or metalorganicchemical vapor deposition (MOCVD), may be practiced at operation 210. Insome embodiments where a Ge-on-insulator (GOI) substrate is received,both Ge and III-V alloy material layers may be gown on the GOI devicelayer as a blanket epitaxial film stack. In addition to growing channelmaterials over the GOI substrate, the epitaxial growth may form one ormore intervening epitaxial layer between the channel materials. Forexample, a III-V alloy (e.g., GaAs) may be grown between a Ge channelmaterial and the GOI substrate. A III-V alloy (e.g., GaAs) may also begrown between a Ge channel material and an InGaAs channel material, forexample.

In some alternative embodiments, a selective epitaxial growth techniqueis practiced at operation 210. For example, aspect ratio trapping (ART)may be employed at operation 310 to achieve acceptable crystal qualityin a heteroepitaxial fin stack. In some exemplary ART embodiments, atrench is formed in an amorphous growth mask material (e.g., adielectric) at operation 210. For such embodiments, the workpiecereceived at operation 210 may, for example, include a silicon layerunder a dielectric growth mask layer. The trench formed at operation 210may expose the silicon and a non-silicon seed layer is grown over thesilicon. In some embodiments, the non-silicon seed layer grown withinthe trench at operation 210 comprises Ge (e.g., intrinsic Ge). In somealternative embodiments, the first crystal layer grown within the trenchat operation 210 comprises a III-V alloy. Germanium, while having adifferent lattice constant than silicon, may be more readily grown froma silicon seeding surface than some III-V alloys. However, GaAs is anexample of a III-V alloy that can be grown from a silicon seedingsurface with reasonable crystal quality when the ART technique ispracticed. Selective film stack growth may continue at operation 210with the growth of at least one non-silicon channel material suitablefor P-type transistors and at least one non-silicon channel materialsuitable for N-type transistors. The epitaxial growth may also form oneor more intervening epitaxial layer between the channel materials. Forexample, a III-V alloy (e.g., GaAs) may be grown between a Ge layer andan InGaAs layer.

Methods 201 continue at operation 220 where a gate structure is formedover channel region of the multi-layered fin. Any “gate first” or “gatelast” process suitable for a finFET may be employed at operation 220 toform a gate stack that is over both channel materials of thesemiconductor material stack. The gate stack formed at operation 220 maydefine the channels of both the P-type and N-type transistorsconcurrently (e.g., self-aligning the channels to the gate stack).

At operation 230, both an N-type source and drain and a P-type sourceand drain are formed. In some embodiments, the P-type source and drainare formed first, for example through any suitable impurity implantationprocess and/or through any suitable epitaxial growth process. The N-typesource and drain may then be formed subsequently, for example throughany suitable impurity implantation process and/or through any suitableepitaxial growth process. Where the techniques for forming the P-typeand N-type source and drain differ, lateral dimensions of the P-type andN-type source and drain may differ significantly, as described furtherbelow.

At operation 240, source and drain terminal contacts are formed to eachof the source and drains. The terminal contacts may be formed with anypatterning and deposition techniques known to be suitable for theformation of contacts and/or conductive vias to finFET structures. Insome embodiments, operation 240 includes deposition of one or moredielectric materials over the source and drain material formed atoperation 230. One or more openings may be patterned into the dielectricmaterials to expose one or more of the source and drains. One or moremetals may be deposited into the openings to contact the one or more ofthe source or drains. Methods 201 then end at operation 260 withcompletion of the transistor structures according to any techniquesknown to be suitable for finFET devices.

FIG. 3 is a flow diagram illustrating methods 301 for fabricatingstacked non-silicon N-type and P-type nanowire transistor structures, inaccordance with some embodiments. Methods 301 are one example of a“gate-last” fabrication process that may be practiced as part of methods201, for example to fabricated CMOS structure 101 (FIG. 1A). FIGS. 4, 5,6, 7A, 7B, 7C, 8, 9, 10 and 11 are isometric views of stackednon-silicon nanowire transistor structures evolving as variousoperations in the methods illustrated in FIG. 2 and/or 3 are performed,in accordance with some embodiments.

Referring first to FIG. 3, methods 301 begin with forming a mask overchannel regions of a multi-layered fin. In the intermediate structure401 illustrated in FIG. 4, a sacrificial gate material 450 and adielectric spacer material 130 has been formed over a channel region ofa multi-layered fin 501 that includes a first semiconductor materiallayer 415A under a second semiconductor material layer 415B. Below eachof semiconductor material layers 415A and 415B is a sacrificialsemiconductor material layer 410. At a base of multi-layered fin 501 isdevice layer 107, which has also been patterned into a base or sub-finportion of multi-layered fin 501. Notably, semiconductor material layers415A and 415B are illustrated as an exemplary single pair of stackedlayers (separated by intervening sacrificial material layer 410).However, any number of layers (e.g., 3 or 4 PMOS/NMOS semiconductormaterial layer pairs) may be defined in a multi-layered fin. One or moreof material layers 415A and 415B may be replicated, for example toincrease the current carrying capability of one or more of a PMOS orNMOS transistor within a footprint of CMOS structure. For example,multi-layered fin 501 may include additional layers 502 shown in dashedline. For some such embodiments, additional layers 502 may include oneor more replications of material layers 415A and 415B, again separatedby intervening sacrificial material 410. In some advantageousembodiments, multiple semiconductor material layers 415A are positionedbelow multiple semiconductor material layers 415B to increase thecurrent carrying capability of both PMOS and NMOS transistors. Hence,the semiconductor material layers drawn in solid line in FIG. 4 may allbe of a first conductivity type (e.g., suitable for PMOS transistors)while the semiconductor material layers drawn in dashed line in FIG. 4may all be of a second conductivity type (e.g., suitable for NMOStransistors).

Semiconductor material layers 415A and 415B may be any of the materialsdescribed above for channel materials 115A and/or 115B (FIG. 1B) as theportion of semiconductor material layers 415A and 415B that are coveredby sacrificial gate material 450 and/or by dielectric spacer material130 are to become channel materials 115A and 115B, respectively.Semiconductor material layers 410 may include any semiconductor materialthat maintains crystallinity of multi-layered fin 501 and has acomposition sufficiently different than material layers 415A and 415Bthat one or more etch processes (e.g., wet chemical etch) can removethem selectively from between material layers 415A and 415B. In someembodiments, both semiconductor material layers 410 are substantiallythe same III-V alloy. In some exemplary embodiments semiconductormaterial layers 410 are GaAs. For embodiments where device layer 107and/or semiconductor material layer 415A is Ge, GaAs is advantageous atleast in terms of lattice match.

Returning to FIG. 3, methods 301 continue with operation 345 where endportions of at least some layers of the multi-layered fin are removedwhile the mask protects the channel portion. In some exemplaryembodiments, end portions of an uppermost one of the non-sacrificialsemiconductor layers are removed to expose end portions of another ofthe non-sacrificial semiconductor layers. Once exposed, a first sourceand drain is formed at operation 360, for example by doping the endportions of the non-sacrificial semiconductor layer, and/or regrowingimpurity-doped semiconductor material. Following formation of the firstsource and drain, a dielectric material may be deposited and planarizedwith a top surface of the channel mask at operation 370. This dielectricmaterial may then be recessed in preparation for formation of the secondsource and drain.

In one exemplary intermediate structure 501 further shown in FIG. 5, endportions of semiconductor material layer 415B have removed, for examplewith a selective etch process, leaving channel material 115B protectedby dielectric spacer 130 and sacrificial gate 450. Semiconductormaterial layer 410 has been similarly removed, for example with aselective etch process, exposing semiconductor material layer 415A. Insome embodiments, semiconductor material layer 415A is then impuritydoped, for example by implanting dopants into the exposed ends ofsemiconductor material layer 415A, to form source and drain 111.Impurities may alternatively be introduced according to any other knowndoping technique (e.g., solid state diffusion, etc.). In theintermediate structure 601 illustrated in FIG. 6, dielectric material180 has been deposited over intermediate structure 501 following theformation of source and drain 111. Dielectric material 180 has beenplanarized with a top surface of sacrificial gate material 450 and thenselectively recessed with a suitable etch process to a level thatexposes ends of channel material 115B while still covering source anddrain 111.

FIGS. 7A, 7B and 7C illustrate alternative methods, respectively, wherea second dielectric spacer 710 is formed adjacent to dielectric spacer130, for example following the exposure of semiconductor material layer415A (e.g., as shown for structure 501 in FIG. 5). Dielectric spacer 710may be formed, for example, with a conformal deposition of a dielectricmaterial having a different composition that of dielectric spacer 130followed by an anisotropic etch. After forming second dielectric spacer710, semiconductor material layer 415A is removed, for example with aselective etch process, leaving at least a residual channel material115A. In the intermediate structure 701 illustrated in FIG. 7A, endportions of all sacrificial semiconductor layers have also been removed,for example with selective etch processes, leaving only device layer107. An epitaxial growth and/or selective deposition process (e.g., MBE,CVD, or MOCVD) may then be employed to form source and drain 111. Theepitaxial growth or deposition process may, for example, selectivelyform Ge or a III-V alloy directly upon device layer 107, for example.The epitaxial growth or deposition process may also, or in thealternative, selectively form Ge or a III-V alloy directly upon anexposed end of channel material 115, for example. The lateral dimensionsof source and drain 111 may be indicative of whether device layer 107was employed as a seeding surface in addition to the exposed end ofchannel material 115. For example, source and drain 111 shown for theintermediate structure 702 in FIG. 7B has a greater lateral length L1than vertical height, which may be indicative of device layer 107 havingserved as a seed layer for the formation of source and drain 111.

In the intermediate structure 703 illustrated in FIG. 7C, dielectricmaterial 180 has been deposited over intermediate structure 702. Onceplanarized with a top surface of sacrificial gate material 450,dielectric material 180 is selectively recessed to a level that exposesends of channel material 115B while still covering source and drain 111.

With the first source and drain protected with dielectric material,methods 301 (FIG. 3) continue at operation 375 where a second source anddrain is formed from ends of the channel material protected by thechannel mask. Any selective deposition or epitaxial process suitable forthe source and drain material may be performed at operation 375. Anexemplary intermediate structure 801 is illustrated in FIG. 8.Intermediate structure 801 includes intermediate structure 601 (FIG. 6)following epitaxial growth of source and drain 112 from ends of channelmaterial 115B. Another exemplary intermediate structure 901 isillustrated in FIG. 9. Intermediate structure 901 includes intermediatestructure 703 (FIG. 7C) following epitaxial growth of source and drain112 from ends of channel material 115B.

Returning to FIG. 3, methods 301 complete at operation 380 where thesacrificial gate material is replaced with any suitable gate stack. Anygate replacement process suitable for nanowire and/or finFET devices maybe practiced at operation 380. In the example further illustrated inFIG. 10, intermediate structure 1001 includes intermediate structure801. As illustrated in the sectional view, sacrificial gate material 450has been removed, which exposes sacrificial semiconductor materiallayers 410 as well as channel materials 115A and 115B. Sacrificialsemiconductor material layers 410 may then be selectively etched.Optionally, any portions of device layer 107 exposed upon removal ofsacrificial gate material 450 may also be stripped off before gate stackmaterials are backfilled over the length of the exposed channel regions.

To form the gate stack, a gate dielectric material may be deposited onsidewalls of the embedded spacer as well as fully surround channelmaterials 115A and 115B. A gate electrode material may be deposited overthe gate dielectric material, ideally backfilling any voids between thesemiconductor channel materials and/or between the semiconductor channelmaterial and isolation dielectric 110. Any known deposition processesmay be employed in the formation of the final gate stack, such as ALD,for example. Prior to gate stack formation, additional dielectricmaterial 180 may be deposited over the source/drain and planarized withthe channel mask.

FIG. 11 further illustrates CMOS device structure 101 following thedeposition of a gate stack that includes gate dielectric 140 and gateelectrode 150, arriving at the structure introduced in FIGS. 1A and 1B.Following formation of the 1 gate stack, CMOS device structure 101 maybe completed with formation of source and drain terminal contactsaccording to any suitable techniques. CMOS device structure 101 may thenbe electrically interconnected with other transistors and/or CMOS devicestructures into integrated circuitry through any known back-end-of-line(BEOL) metallization processes.

FIG. 12 illustrates a mobile computing platform and a data servermachine employing a processor 1250 including stacked device circuitryhaving vertically stacked N-Type and P-Type transistors with non-siliconchannel semiconductor, for example as described elsewhere herein. Theserver machine 1206 may be any commercial server, for example includingany number of high-performance computing platforms disposed within arack and networked together for electronic data processing. The mobilecomputing platform 1205 may be any portable device configured for eachof electronic data display, electronic data processing, wirelesselectronic data transmission, or the like. For example, the mobilecomputing platform 1205 may be any of a tablet, a smart phone, laptopcomputer, etc., and may include a display screen (e.g., a capacitive,inductive, resistive, or optical touchscreen), a chip-level orpackage-level integrated system 1210, and a battery 1215.

Disposed within the integrated system 1210, a substrate 1260 includesstacked processor circuitry 1240 (e.g., a microprocessor, a multi-coremicroprocessor, graphics processor, or the like). The stacked circuitrymay include vertically stacked N-Type and P-Type transistors withnon-silicon channel semiconductor, for example as described elsewhereherein. For monolithic embodiments, substrate 1260 is a semiconductorchip. For other embodiments, substrate 1260 may be any packagesubstrate, or an interposer. Processor circuitry 1240, or a separateRFIC chip may be further coupled to an antenna (not shown) to implementany of a number of wireless standards or protocols, including but notlimited to Wi-Fi (IEEE 1302.11 family), WiMAX (IEEE 802.16 family), IEEE802.20, long term evolution (LTE), Ev-DO, HSPA+, HSDPA+, HSUPA+, EDGE,GSM, GPRS, CDMA, TDMA, DECT, Bluetooth, derivatives thereof, as well asany other wireless protocols that are designated as 3G, 4G, 5G, andbeyond.

FIG. 13 is a functional block diagram of an electronic computing device1300, in accordance with some embodiments. Computing device 1300 may befound inside platform 1205 or server machine 1206, for example. Device1300 further includes a motherboard 1302 hosting a number of components,such as, but not limited to, a processor 1304 (e.g., an applicationsprocessor), which may further incorporate sidewall terminal contacts,for example in accordance with embodiments described herein. Processor1304 may be physically and/or electrically coupled to motherboard 1302.In some examples, processor 1304 includes an integrated circuit diepackaged within the processor 1304. In general, the term “processor” or“microprocessor” may refer to any device or portion of a device thatprocesses electronic data from registers and/or memory to transform thatelectronic data into other electronic data that may be further stored inregisters and/or memory.

In various examples, one or more communication chips 1306 may also bephysically and/or electrically coupled to the motherboard 1302. Infurther implementations, communication chips 1306 may be part ofprocessor 1304. Depending on its applications, computing device 1300 mayinclude other components that may or may not be physically andelectrically coupled to motherboard 1302. These other componentsinclude, but are not limited to, volatile memory (e.g., MRAM 1330, DRAM1332), non-volatile memory (e.g., ROM 1335), flash memory, a graphicsprocessor 1322, a digital signal processor, a crypto processor, achipset, an antenna 1325, touchscreen display 1315, touchscreencontroller 1375, battery 1310, audio codec, video codec, power amplifier1321, global positioning system (GPS) device 1340, compass 1345,accelerometer, gyroscope, audio speaker 1320, camera 1341, and massstorage device (such as hard disk drive, solid-state drive (SSD),compact disk (CD), digital versatile disk (DVD), and so forth), or thelike.

Communication chips 1306 may enable wireless communications for thetransfer of data to and from the computing device 1300. The term“wireless” and its derivatives may be used to describe circuits,devices, systems, methods, techniques, communications channels, etc.,that may communicate data through the use of modulated electromagneticradiation through a non-solid medium. The term does not imply that theassociated devices do not contain any wires, although in someembodiments they might not. Communication chips 1306 may implement anyof a number of wireless standards or protocols, including but notlimited to those described elsewhere herein. As discussed, computingdevice 1300 may include a plurality of communication chips 1306. Forexample, a first communication chip may be dedicated to shorter-rangewireless communications, such as Wi-Fi and Bluetooth, and a secondcommunication chip may be dedicated to longer-range wirelesscommunications such as GPS, EDGE, GPRS, CDMA, WiMAX, LTE, Ev-DO, andothers.

While certain features set forth herein have been described withreference to various implementations, this description is not intendedto be construed in a limiting sense. Hence, various modifications of theimplementations described herein, as well as other implementations,which are apparent to persons skilled in the art to which the presentdisclosure pertains are deemed to lie within the spirit and scope of thepresent disclosure.

It will be recognized that principles of the disclosure are not limitedto the embodiments so described, but can be practiced with modificationand alteration without departing from the scope of the appended claims.For example the above embodiments may include specific combinations offeatures as further provided below.

However, the above embodiments are not limited in this regard and, invarious implementations, the above embodiments may include theundertaking only a subset of such features, undertaking a differentorder of such features, undertaking a different combination of suchfeatures, and/or undertaking additional features than those featuresexplicitly listed. The scope of the invention should, therefore, bedetermined with reference to the appended claims, along with the fullscope of equivalents to which such claims are entitled.

What is claimed is: 1-23 (canceled)
 24. An integrated circuit (IC)device structure, the structure comprising: a material stack including afirst channel material and a second channel material, wherein the firstchannel material comprises a first non-silicon semiconductor materialand the second channel material comprises a second non-siliconsemiconductor material; a first source and a first drain coupled to thefirst channel material wherein the first source and the first drain haveP-type conductivity; a second source and a second drain coupled to thesecond channel material, wherein the second source and the second drainhave N-type conductivity; and a gate electrode adjacent to a sidewall ofthe first and second channel materials; and a gate dielectric betweenthe gate electrode and the sidewall of the first and second channelmaterials.
 25. The IC device structure of claim 24, wherein: the firstchannel material comprises Ge; and the second channel material comprisesa III-V alloy.
 26. The IC device structure of claim 25, wherein thesecond channel material comprises In, Ga and As with an In contentbetween 0.2 and 0.4.
 27. The IC device structure of claim 25, wherein:the second channel material is over the first channel material; and thesecond source and drain is over the first source and drain with adielectric material therebetween.
 28. The IC device structure of claim27, wherein the first source and drain extend at least a first laterallength from the gate electrode, and the second source and drain extendno more than a second lateral length, less than the first laterallength, from the gate electrode.
 29. The IC device structure of claim24, wherein a portion of the gate electrode and the gate dielectric isbetween the first and second channel materials.
 30. The IC devicestructure of claim 29, wherein the material stack is over a substratedielectric layer, and a portion of the gate electrode and the gatedielectric is between the first channel material and the substratedielectric layer.
 31. The IC device structure of claim 30, wherein thefirst source and drain is in contact with the substrate dielectriclayer.
 32. The IC device structure of claim 29, wherein: the materialstack is over a crystalline trench material within a trench that extendsthrough a substrate dielectric layer; and a portion of the gateelectrode and the gate dielectric is between the first channel materialand the crystalline trench material.
 33. The IC device structure ofclaim 32, wherein the crystalline trench material comprises Ge or bothGa and As.
 34. The IC device structure of claim 24, further comprising:a first device terminal contact coupled to at least one of the firstsource and drain, or the second source and drain; and a second deviceterminal contact coupled to at least one of the first source and drain,or the second source and drain.
 35. The IC device structure of claim 34,wherein: the first device terminal contact is in contact with a first ofthe first source and drain; the second device terminal contact is incontact with a second of the first source and drain; and furthercomprising: a third device terminal contact in contact with a first ofthe second source and drain; and a fourth device terminal contact incontact with a second of the second source and drain.
 36. The IC devicestructure of claim 34, wherein at least one of: the first deviceterminal contact is in contact with both a first of the first source anddrain, and a first of the second source and drain; or the second deviceterminal contact is in contact with both a second of the first sourceand drain, and a second of the second source and drain.
 37. Anintegrated circuit (IC) device, comprising: a processor core; and amemory coupled to the processor core, wherein the processor corecomprises a first transistor stacked with a second transistor, andwherein: the first transistor comprises a first source and a first draincoupled to a first channel material, wherein the first channel materialcomprises a first non-silicon semiconductor material, and the firstsource and the first drain have P-type conductivity; the secondtransistor comprises a second source and a second drain coupled to asecond channel material, wherein the second channel material comprises asecond non-silicon semiconductor material, and the second source and thesecond drain have N-type conductivity; a gate electrode is adjacent to asidewall of the first and second channel materials; and a gatedielectric is between the gate electrode and the sidewall of the firstand second channel materials.
 38. The IC device of claim 37, wherein:the first channel material comprises Ge; the second channel materialcomprises a III-V alloy; the second channel material is over the firstchannel material; and the second source and drain is over the firstsource and drain with a dielectric material therebetween.
 39. The ICdevice of claim 38, wherein the first source and drain extend at least afirst lateral length from the gate electrode, and the second source anddrain extend no more than a second lateral length, less than the firstlateral length, from the gate electrode.
 40. The IC device of claim 38,wherein a portion of the gate electrode and the gate dielectric isbetween the first and second channel materials.
 41. A method offabricating an integrated circuit (IC) device structure, the methodcomprising: forming a multi-layered material stack comprising aplurality of non-silicon semiconductor layers; forming a gate stack overthe material stack, wherein the gate stack comprises a gate electrodeand a gate dielectric; forming a P-type source and a P-type drain onopposite sides of the gate stack and in contact with a first layer ofthe fin; forming an N-type source and an N-type drain on opposite sidesof the gate stack and in contact with a second layer of the fin; forminga first terminal contact to one or more of the P-type source and N-typesource; and forming a second terminal contact to one of one or more ofthe P-type drain and N-type drain.
 42. The method of claim 41, whereinforming the multi-layered material stack further comprises: forming afirst layer comprising a first of GaAs or Ge; forming a second layerover the first layer, the second layer comprising a second of GaAs or Geforming a third layer over the second layer, the third layer having thesame composition as the first layer; and forming a fourth layer over thethird layer, the fourth layer comprising In and Ga and As.
 43. Themethod of claim 42, wherein: the first layer comprises Ge on adielectric layer comprising an oxygen; and forming the multi-layeredmaterial stack further comprises epitaxially growing second, third, andfourth layers over the first layer.